Abstract
In this work reflectance (R) and thermoreflectance (TR) spectra in the infra-red of bulk P and B heavily doped silicon samples are reported and discussed. The values of the scattering time and of the effective mass, as well as the temperature derivative of the plasma frequency, scattering time and high-frequency dielectric constant are extracted from the data and analysed in terms of free-carrier-photon and free-carrier-impurity interaction.
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