Abstract
Historically, the resolution achievable in an electron microscope has been limited by the unavoidable aberrations of the lenses used to form the image [1]. However recently, aberration correctors have been shown to be able to improve both the ultimate resolution attainable, and the current available to form the image at any given resolution [2]. The resolution in aberration corrected instruments will soon approach the quantum mechanical limits, and we investigate how these limits depend on the imaging mode used.
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