Abstract
Data on computer modeling a meniscus image of a crystal grown by the Czochralski method from a high-temperature melt are presented. A fine structure of the crystallization zone image formed by an optical projection system is investigated as well as the image components conditioned by intrinsic emission of the heater, melt, and crystal, and by emission reflections from melt and crystal surfaces. Causes of meniscus image parallax are analyzed; its influence on metrological characteristics of the optical crystal geometry control system is assessed.
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