Abstract

AbstractWith our present concern for a secure environment, the development of new radiation detection materials has focused on the capability of identifying potential radiation sources at increased sensitivity levels. As the initial framework for a materials-informatics approach to radiation detection materials, we have explored the use of both supervised (Support Vector Machines – SVM and Linear Discriminant Analysis – LDA) and unsupervised (Principal Component Analysis – PCA) learning methods for the development of structural signature models. Application of these methods yields complementary results, both of which are necessary to reduce parameter space and variable degeneracy. Using a crystal structure classification test, the use of the nonlinear SVM significantly increases predictive performance, suggesting trade-offs between smaller descriptor spaces and simpler linear models.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.