Abstract
In this work we propose Bayesian measures to quantify the influence of observations on the structural parameters of the simple measurement error model (MEM). Different influence measures, like those based on q-divergence between posterior distributions and Bayes risk, are studied to evaluate the influence. A strategy based on the perturbation function and MCMC samples is used to compute these measures. The samples from the posterior distributions are obtained by using the Metropolis–Hastings algorithm and assuming specific proper prior distributions. The results are illustrated with an application to a real example modeled with MEM in the literature.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
