Abstract
The influence of 1.1 wt% tin additions on the precipitation hardening of Cu-11 wt% Ni-20 wt% Zn alloy was studied by Differential Scanning Calorimetry (DSC), microhardeness measurements and High Resolution Transmission Electron Microscopy (HRTEM). The calorimetric curves, in the range of temperatures analyzed, show the presence of two exothermic reactions in the ternary alloy, associated to the short-range-order development assisted by migration of excess vacancies. On the other hand, one exothermic and one endothermic reaction are observed in the quaternary alloy, associated to the formation and dissolution of Cu 2 NiZn precipitates, respectively. It has been show that an addition of 1.1% tin plays an important role in the formation of Cu 2 NiZn precipitates, responsible for the precipitation hardening of the ternary alloy.
Highlights
La industria naval y aeroespacial demanda nuevos materiales microestructuralmente estables dotados de una elevada resistencia mecánica a la vez que una alta conductividad eléctrica y/o térmica y una gran resistencia a la corrosión (Groza y Gibeling, 1993)
Thermal behavior of short range-order in quenched Cy-12 at.% Mn assessed by DSC
kinetic evaluations conducted in a quasi-binary Cu-1 at.% Co2Si
Summary
Las aleaciones utilizadas se prepararon en un horno de inducción, en atmósfera inerte (Ar), a partir de las cantidades estequiométricas de cobre electrolítico (99,95% de pureza), níquel, cinc y estaño de alta pureza para obtener la composición de la aleación deseada. Los diagramas de DSC se han registrado a diferentes velocidades de calentamiento (β=5, 10, 20, 30 y 40 K min−1), bajo un flujo de argón de 10−4 m3 min−1, utilizando como referencia un disco de cobre de alta pureza recocido durante un largo período. Los valores de α a cada temperatura se calcularon a partir del cociente entre el área de la curva de DSC hasta la temperatura considerada y el área total de la curva siguiendo el método convencional descrito en trabajos anteriores (Donoso, 2010; Donoso, 2014). Los diagramas de difracción de rayos X (XRD) se registraron con un difractómetro PHILIPS Xpert Pro equipado con un detector de centelleo y un monocromador de grafito empleando un voltaje de 40 kV y 30 mA
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