Abstract

In organic field-effect transistors (OFETs), the quality of charge-transport pathway, controlled by crystal structures of organic semiconductors (OSCs), strongly affects the performance of the device. To achieve higher charge mobility, solution-processed single-crystal (SPSC) techniques have been used to decrease crystal defects by aligning the crystals of OSCs in the in-plane direction. Nonetheless, through SPSC techniques, whether the crystalline lattices are well-aligned in the out-of-plane direction and how the out-of-plane lattice misorientaion affects OFET performances remain unclear. Here, a characterization protocol based on polarized optical microscope, X-ray diffraction, and electron diffraction is established to identify the lattice structure, the in-plane and out-of-plane lattice alignment in the crystal array of 6,13-bis(triisopropylsilylethynyl)pentacene (TIPS-PEN). Regardless of the solvents used in the PDMS-assisted crystallization, the characterization protocol confirms that all the cryst...

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