Abstract

In this paper, the anisotropic flux avalanche processes in thin square-shaped type-II superconducting films are numerically investigated by solving the coupled nonlinear Maxwell’s equations and the thermal diffusion equations. Influences of the non-uniformities and intrinsic critical current density anisotropies originate from the manufacturing process are considered in the simulation. In addition, we also studied the effect of the extrinsic anisotropy induced by the in-plane magnetic field. The results demonstrate that the non-uniformities and anisotropies of the critical current density play significant roles in the flux avalanche process of the thin film superconductors. Slight anisotropy (either intrinsic or extrinsic) can dramatically change the propagation direction of avalanches in the superconducting film, which is consistent with the experimental results. Simulations on the thin square-shaped isotropic superconducting films show that the threshold magnetic field for the flux avalanches increases with the angle between the applied field and the superconducting film-plane. In addition, the flux avalanche patterns change with the angular variation of the in-plane component of external magnetic field. When the in-plane magnetic field component is along the diagonal lines of the superconducting square, symmetric flux avalanche penetration patterns occur to the film.

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