Abstract

Since the report of high zT in Si95Ge5 there has been significant interest in low Ge alloy compositions for thermoelectric applications. The application of YbP was explored as a means to lower thermal conductivity. A series of 3% phosphorus (P) doped n-type Si95Ge5 (SiGe) alloy was reacted with YbH2 (0, 1, 2%). YbP was formed in the SiGe alloy matrix from the reaction between YbH2 and P during the Spark Plasma Sintering (SPS) process. Thermoelectric property measurements were performed on sintered pellets from room temperature to 1273 K. X-ray diffraction patterns were collected from the ground powder samples and confirmed the main phase possessed diamond structured Si95Ge5 (space group: Fd3¯m) as well as the presence of YbP (space group: Fm3¯m). The carrier concentration of the sample was controlled by the amount of YbH2 added, removing some of the phosphorus to form YbP. n-type Si95Ge5 alloy samples with higher YbP amounts showed higher electrical resistivity and lower thermal conductivity attributed to loss of the P dopant. Another composite series of n-type Si95Ge5 with YbP were synthesized with additional P compositions (1, 2%). The thermoelectric properties were characterized from room temperature to 1273 K, and the samples possess electrical resistivity, carrier concentrations, and thermal conductivity as expected from the additional P dopant. The presence of YbP lowered lattice thermal conductivity when the sample was appropriately doped. The Seebeck coefficients were measured with both off-axis and uniaxial axis experimental configurations. These results show that the off-axis measurements overestimate the Seebeck coefficients of the Si95Ge5 alloy samples. This is attributed to a cold finger effect and therefore only the uniaxial data are combined for zT calculations. The n-type Si95Ge5 samples with YbP and less than 3% P dopant show similar zT compared with the Si95Ge5 sample with no YbP inclusions and 3% P dopant with a peak zT of 0.6 at 1200 K.

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