Abstract
Finite-difference time-domain (FDTD) simulations showed that the reflectance spectra of crystalline Si nanopillar (NP) arrays with diameters of 40, 70, 100, and 130 nm differed depending on wetting state. The observed reflectance dips of the 40-nm-diameter NP array were in good agreement with those estimated from destructive interference conditions at the top and bottom of the NPs: the NP arrays were treated as a homogeneous medium with an effective permittivity according to the effective medium approximation model. In contrast, the dip positions of the FDTD-simulated spectra for 70-, 100-, and 130-nm-diameter NP arrays deviated from the results of interference calculations, particularly for short wavelengths. This suggested that Mie resonances in individual NPs significantly increased the absorption cross-section at the resonant wavelengths, which was sensitive to the refractive index of the surrounding medium (i.e., the wetting state). Optical reflectance measurements provide an easy and efficient means of inspecting the wetting behavior of non-flat surfaces.
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