Abstract

Low-angle grain boundaries with misorientation angles theta < 5 degrees in optimally doped thin films of YBCO are investigated by magnetooptical imaging. By using a numerical inversion scheme of Biot-Savart's law the critical current density across the grain boundary can be determined with a spatial resolution of about 5 micrometers. Detailed investigation of the spatially resolved flux density and current density data shows that the current density across the boundary varies with varying local flux density. Combining the corresponding flux and current pattern it is found that there exists a universal dependency of the grain boundary current on the local flux density. A change in the local flux density means a variation in the flux line-flux line distance. With this knowledge a model is developped that explains the flux-current relation by means of magnetic vortex-vortex interaction.

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