Abstract
The structural, compositional, morphological and optical properties of as-deposited and vacuum annealed CuInS2 thin films prepared by successive ionic layer adsorption and reaction method are studied by X-ray diffractometer, energy dispersive X-ray analyzer, scanning electron microscope and spectrophotometer respectively. The influence of vacuum annealing on the properties of CuInS2 (CIS) thin films is discussed, annealing duration has also been optimized and reported in this paper.
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