Abstract
Tin sulphide thin films of p‐type conductivity were grown on glass substrates. The refractive index of the as grown films were calculated using both transmission and spectroscopic ellipsometry (SE) data. The SE data was fit using Tauc Lorentz model which showed that the films did not absorb for λ > 700 nm. The variation in all the films refractive index with respect to wave‐ length, i.e. the dispersion behaviour of the films in region 700 < λ < 1000 nm were found to follow the Wemple‐Dedomenico (WDD) single oscillator model. The optical properties of the films were found to be closely related to the structural properties of the films. Intrinsic crystal disorders, tin vacancies in p‐SnS thin films leads to ap‐ pearance of defect levels (Urbach tail) within the band‐ gap. The band‐gap and the band tail's spread, intimately controls the refractive index of the films.
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