Abstract
The intensity of polarized spontaneous emission as a function of uniaxial stress in p-Ge is studied. It is found that with rising of stress dependence of the radiation polarization rotates by π/2. The effect is explained by the modification of the energy spectrum of free and impurity states under the uniaxial compression.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
