Influence of Ti film thickness and oxidation temperature on TiO2 thin film formation via thermal oxidation of sputtered Ti film

Abstract

Single-phase rutile TiO2 films with good crystallinity were obtained by thermal oxidation of sputtered Ti films on Si and quartz substrates. The influence of the Ti film thickness on oxidation was systematically investigated. A temperature of 823K was sufficient to fully oxidize Ti films of <0.2μm in thickness, but 923K was required for complete oxidation of thicker films. The crystal structure, phase, composition, and optical properties of the TiO2 films were investigated using X-ray diffraction (XRD), Raman spectroscopy, energy-dispersive X-ray analysis (EDAX), and UV-vis-NIR spectroscopy. XRD and Raman analyses showed that the TiO2 films are rutile phase. The bandgap of the TiO2 films decreased with increasing thickness. A growth mechanism for TiO2 thin films due to thermal oxidation of sputtered Ti films is proposed. Oxidation commences from the surface and proceeds inside the bulk and Ti→TiO2 phase transformation occurs via different intermediate phases. We found that the oxidation temperature rather than the duration is the dominant factor in the growth of TiO2 thin films.