Abstract
The influence of annealing at a temperature of 750–830°C on the electrophysical, luminescent, and structural characteristics of GaAs layers doped with various concentrations of tin is studied. It is shown that, for low doping levels, the layers possess properties with high thermal stability. During annealing, one observes a lowering of the concentration of electrons, a reduction of the lattice periodicity, and a change in the photoluminescence spectra of strongly-doped layers, which is explained by the process of the formation of complexes and by the decomposition of supersaturated solid solutions of impurity dopants.
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