Influence of thermal disturbances on profilometric measurements of surface asperities

Abstract

During the surface topography measurements, changes in the ambient temperature affect the elongation of both the tested object and the measuring device. This influence is insignificant and often negligible, when measuring a single two-dimensional profile, which lasts from a few to several minutes. However, during spatial measurements lasting over several hours, changes in the ambient temperature cause texture mapping errors. The research included assessment of impact of changes in the ambient temperature of a tactile profilometer on the results of surface topography measurements.In the paper methodology of surface topography measurements under controlled temperature conditions is described. Thermal influence of the environment on the errors in mapping of surface topography were also determined. Measurements were carried out in a specially designed climatic chamber. Results of multiple measurements of the same reference surface profile in constant and variable thermal conditions of the environment were presented. Such procedure allowed for the presentation of a two-dimensional transverse profile of a generated surface, varying as a function of temperature. Generated surfaces were parameterized and compared with each other. The results of the research allowed us to state that changes in the ambient temperature during the measurements of the surface topography affect the mapping errors of the measured structure. Temperature changes and measurement results are strongly linearly correlated with each other.