Abstract
Using the two-dimensional finite difference time domain method, we report on the image formation of an apertureless scanning near field optical microscope. It is found that the obtained images are influenced by the angle at which the probe interacts with a dielectric sample under total internal reflection illumination. The scanning probe is assumed to be a sharp silver tip with similar shape to those used in atomic force microscopy. We show that the near-field optical response produced by semi-circular and square imperfections are significantly affected with small (0°–10°) variations of the probe-sample interaction angle.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
