Abstract
Resonance ionization mass spectrometry is an ultra-sensitive and highly element selective tool for spectroscopy, ionization and detection of atoms and thus enables rare isotope determination. In combination with spatially resolved sputtering of neutrals by an initial ion beam, e.g. within a commercial secondary ion mass spectrometer, an isotope and isobar selective analysis technique with resolution on the micrometer scale for particles and surfaces is realized. Detection of minuscule amounts of specific actinides, e.g. of plutonium, in environmental and technical samples by this ultra-trace analysis technique requires detailed knowledge about the atomic physics of the element. Identification and characterization of the specific resonance ionization scheme applied within the particular geometry of the apparatus in use is needed. An analysis of the dependence of the specifications, specifically regarding the influence of the relative laser beam polarizations is presented here as an aspect, that could have a severe impact on isotope ratio precision and overall efficiency in the resulting ion signal.
Highlights
The resonant laser secondary neutral mass spectrometry system at the Institute of Radioecology and Radiation Protection (IRS) in Hannover, Germany was set up to analyze sample surfaces with highest elemental selectivity for their isotopical composition [1, This article is part of the Topical Collection on Proceedings of PLATAN 2019, 1st International Conference, Merger of the Poznan Meeting on Lasers and Trapping Devices in Atomic Nuclei Research and the International Conference on Laser Probing, Mainz, Germany 19-24 May 2019 Edited by Krassimira Marinova, Michael Block, Klaus D.A
The influence of relative laser beam polarizations could critically affect the sensitivity for different isotopes, if large hyperfine structures are involved in the optical excitation and ionization process
This spectrometer is equipped with a Bi Nanoprobe, i.e. a 30 keV bismuth primary ion (PI) gun, for sputtering and a reflectron type time of flight (TOF) mass analyzer with a mass resolution well above 1000 for analysis of the secondary ion beam
Summary
The resonant laser secondary neutral mass spectrometry (rL-SNMS) system at the Institute of Radioecology and Radiation Protection (IRS) in Hannover, Germany was set up to analyze sample surfaces with highest elemental selectivity for their isotopical composition [1, This article is part of the Topical Collection on Proceedings of PLATAN 2019, 1st International Conference, Merger of the Poznan Meeting on Lasers and Trapping Devices in Atomic Nuclei Research and the International Conference on Laser Probing, Mainz, Germany 19-24 May 2019 Edited by Krassimira Marinova, Michael Block, Klaus D.A. Wendt and Magdalena Kowalska
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
