Abstract

Within the materials deposition techniques, Spatial Atomic Layer Deposition (SALD) is gaining momentum since it is a high throughput and low-cost alternative to conventional atomic layer deposition (ALD). SALD relies on a physical separation (rather than temporal separation, as is the case in conventional ALD) of gas-diluted reactants over the surface of the substrate by a region containing an inert gas. Thus, fluid dynamics play a role in SALD since precursor intermixing must be avoided in order to have surface-limited reactions leading to ALD growth, as opposed to chemical vapor deposition growth (CVD). Fluid dynamics in SALD mainly depends on the geometry of the reactor and its components. To quantify and understand the parameters that may influence the deposition of films in SALD, the present contribution describes a Computational Fluid Dynamics simulation that was coupled, using Comsol Multiphysics®, with concentration diffusion and temperature-based surface chemical reactions to evaluate how different parameters influence precursor spatial separation. In particular, we have used the simulation of a close-proximity SALD reactor based on an injector manifold head. We show the effect of certain parameters in our system on the efficiency of the gas separation. Our results show that the injector head-substrate distance (also called deposition gap) needs to be carefully adjusted to prevent precursor intermixing and thus CVD growth. We also demonstrate that hindered flow due to a non-efficient evacuation of the flows through the head leads to precursor intermixing. Finally, we show that precursor intermixing can be used to perform area-selective deposition.

Highlights

  • Atomic layer deposition (ALD) is a material deposition process that allows for a homogeneous, conformal thin film deposition with a nanometric thickness control

  • atomic layer deposition (ALD) cycles are characterized by having a defined growth per cycle (GPC) that depends on the chemical properties of the precursor, the temperature of the surface, and the reactor geometry

  • In the ALD regime, the reactants must be chemisorbed, and ideally, saturate the surface before introducing the second reactant that leads to a complete surface reaction, creating a monolayer of the product

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Summary

Introduction

Atomic layer deposition (ALD) is a material deposition process that allows for a homogeneous, conformal thin film deposition with a nanometric thickness control. Instead of defining each step by a time separation, and to achieve the same chemical half reactions that take place during the temporal ALD cycles, in SALD, precursors are injected continuously in different spatial regions of the reactor and the substrate is exposed alternately to the different flows, separating each subsequent exposure with an intermediate exposure to an inert gas, to purge the substrate of the half-reaction by-products, and/or excess of precursor. In the ALD regime, the reactants must be chemisorbed, and ideally, saturate the surface before introducing the second reactant that leads to a complete surface reaction, creating a monolayer of the product This key difference can be tuned arbitrarily in close-proximity SALD systems in which the deposition gap can be mechanically changed and it may provide versatility to tune the regime even in the middle of a deposition process [14].

Methods and Processes
Evaluation of the Velocity Profile and Pressure in the Head-Substrate Gap
Computational
Concentration
Results
Efficiency of the Deposition System Exhaust
CVD regime deposition
CVD Regime Influenced by a Tilt in the Deposition Gap
Simulation results forfora atilt
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