Influence of the epitaxial growth and device processing on the overlay accuracy during processing of the d-DotFET

Abstract

To maintain the development of MOSFET devices in the last three decades the lateral layout of this important device was scaled down into the sub-50 nm range. The challenge to maintain device performance was met by applying to scaling rules, which ensure a proper physical behaviour in the active area of the device. But nowadays new device architectures as Ultra Thin Body and Multi Gate devices have to be discussed. Furthermore new materials were introduced as high-κ gate dielectrics and metal gates. In recent years strained silicon has drawn increasing attention to enlarge carrier mobility in the MOSFET channel. In the d-DotFET approach locally strained silicon is formed by means of template-assisted self assembly of Ge-dots and silicon overgrowth. The silicon capping layer is strained on top of the dot and in its near vicinity, only. The accurate positioning of the dots on pre-patterned substrates enables the utilization of these substrates for further device processing. The crucial issue is to integrate the active area on top of the dot, which requires an overlay of ± 10 nm, which has to be assured over the whole process. In this paper we investigate the intrinsic overlay of a Vistec EBPG 5000 plus e-beam system using etched holes in silicon as markers. It was found, that the required overlay accuracy can be obtained, when the definition of the marker sites is adapted to the following process, already. The overlay is not affected by device processing, as long as the markers are affected symmetrically.