Abstract

Effects of sulfurization pressure on composition, morphology and microstructure of kesterite Cu2ZnSnS4 (CZTS) thin films obtained by sulfurization of the metallic layers have been investigated in detail. It is found that the S content in the CZTS thin films is strongly dependent on the sulfurization pressure. The CZTS thin films sulfurized under low sulfurization pressure have S-poor state with a bilayer structure, while it exhibits sufficient amounts of sulfur under high sulfurization pressure with grain growth throughout the entire absorber film. X-ray diffraction data indicate lower sulfurization pressure during the CZTS grain growth process can induce the formation of more structural defects in the CZTS lattice and the CZTS thin films sulfurized under high sulfurization pressure have more random orientation. Furthermore, ZnS and MoS2 phase exist in all samples determined by Fourier transform infrared reflectance spectroscopy as complementary to Raman spectroscopy. The solar cell fabricated with the CZTS thin film under 10 Torr sulfurization pressure shows the best conversion efficiency of 3.52% (VOC = 484 mV, JSC = 14.56 mA cm−2, FF = 50.1%).

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