Abstract

In present article ZnO thin films were deposited for five different substrate temperatures (150-350 oC) using simple spray technique. The deposited films have been characterized using X-ray diffractometer (XRD), Scanning Electron Microscope (SEM) and UV-Visible spectroscopy and effect of substrate temperature on structure, morphology, and optical properties have been studied. Crystallite size was estimated from using Lorentz Fit of XRD data. The crystallite size was in the 20 to 26.32 nm range. The SEM of (ZnO 300 ) film sample shows whole surface was uniformly coated with schematically arranged network of ZnO wires of average diameter 566 nm. Purity of the deposited sample was investigated by using Energ Dispersive X-ray Analysis (EDX). All the ZnO films exhibit 70 to 80% transmittance and 3.23 to 3.26 eV optical band gap.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call