Abstract
Bi2O3 thin films were deposited on ultrasonically-cleaned glass and mica substrates by close-spaced vacuum sublimation technique. Films surface morphology was studied using scanning electron microscopy (SEM). Structural study based on the transmission-electron microscopy (TEM) and selected-area electron diffraction (SAED) analysis has been shown that deposited films were polycrystalline with face-centered cubic structure. Optical study was carried out by spectral photometry analysis in the wavelengths range λ = 320–900 nm using the optical transmittance and absorbance measurements. For determination optical band gap Eg the Tauc plot was used and the band gap energy Eg is determined in the range of 3.50–3.62 eV, respectively. Fourier-transform infra-red (FTIR) analysis shown that obtained films are well-crystalline and have a good optical quality.
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