Abstract
The far-field angular response pattern for dipole antenna-coupled infrared detectors is investigated. These devices utilize an asymmetric metal-oxide-metal diode that is capable of rectifying infrared-frequency antenna currents without applied bias. Devices are fabricated on both planar and hemispherical lens substrates. Measurements indicate that the angular response can be tailored by the thickness of the electrical isolation standoff layer on which the detector is fabricated and/or the inclusion of a ground plane. Electromagnetic simulations and analytical expressions show excellent agreement with the measured results.
Highlights
The radiation pattern of a transmitting antenna and by reciprocity, the angular response pattern of a receiving antenna, is dependent upon the type of antenna and its surroundings [1]
This paper studies the direct detection of a continuous wave incident beam through the use of a rectifying diode coupled to a dipole antenna
This paper investigates the influence of the substrate configuration on the far-field angular response pattern for infrared antennas
Summary
The radiation pattern of a transmitting antenna and by reciprocity, the angular response pattern of a receiving antenna, is dependent upon the type of antenna and its surroundings [1]. If an antenna is placed at the interface of two dielectrics, the pattern will differ from that of an antenna in free space due to the boundary conditions imposed on the electromagnetic fields [2]. By manipulating the substrate configuration of a receiving antenna, the angular response pattern can be modified in a controlled manner. To study the effects of the substrate on the angular response pattern of infrared antennas, three different device configurations are considered: a planar substrate with an insulator layer above a ground plane, germanium hemispherical lens substrate with insulator layer, and the latter with an additional insulation layer and ground plane
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