Abstract

Controlling defect density in ultrathin polymer films is of great importance to the microelectronics industry. Using polystyrene (PS) as a model system, we demonstrated the influence of the underlying surface chemistry on polymer mobility as manifested through changes in glass transition temperature ( T g) and dewetting behavior. All high molecular weight ( M w=90k) polystyrene (PS H) films exhibited T g depressions (1–12 °C) with decreasing film thickness (90–18 nm). Self-assembled monolayer (hexadecanoic acid) surfaces show the greatest influence on T g depression, followed by gold and silicon surfaces. Gold capping of PS H films on silicon had no distinct effect compared to their uncapped counterparts. Low molecular weight ( M w=4k) polystyrene (PS L) films dewet on glass and self-assembled monolayer (SAM) surfaces. PS L films on SAM surfaces dewet thicker and to a greater extent than those on glass. Gold, both as a substrate and as a capping layer, suppressed dewetting for all film thicknesses measured. We curve-fit T g behavior using a three-layer model with adjustable layer densities directly translating into changes in T g. We calculated the long-range forces between the polymer film and the substrate. The resulting pressure increases could not directly account for our changes in T g but coincided with our experimental observations for non-metallic interfaces.

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