Abstract
The influence of spatial distribution of radiation intensity on results of steady-state photocarrier grating (SSPG) measurements is analyzed. This technique uses the interference pattern obtained over an illuminated sample surface when two coherent radiation beams hit the sample at different angles of incidence. The sample usually consists of a thin semiconductor film on a thick, parallel-sided substrate. In this paper, the interference of radiation internally reflected in the thin film as well as internally reflected in the substrate are taken into consideration. These phenomena evoke complicated spatial distributions of radiation in a sample, and consequently they affect the magnitude of photoconductivity. The value of SSPG response can be even a few times greater than the predicted one for a homogeneous distribution of light over the thickness of a semiconductor film. If one does not take this effect into account, the carrier diffusion lengths estimated with the SSPG technique may vary from those suggested by the measurement.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
