Abstract
In this paper we investigate the dependence of Parsons-Zobel plots on characteristic self-affine roughness parameters of the metal electrode in electrical double layers. Among the roughness amplitude w, the correlation length xi, and roughness exponent H, the latter appears to have the most prominent effect especially for values in the range H<0.5. In addition, with decreasing compact layer thickness the influence of roughness leads to stronger nonlinear behavior of the plots for relatively large electrode potentials. Finally, it is shown that dynamic changes of the electrode roughness (for example by growth on metal films) should be carefully quantified with respect to their influence on the Parson-Zobel plots and related double-layer systems.
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