Abstract
AbstractThe traditional melt quenching method was used to prepare new zinc boroselenite glasses in the system xSeO2·(50 − x)ZnO·50B2O3 with varying SeO2/ZnO molar ratio. X-ray diffraction patterns (XRD) have revealed an amorphous structure in glasses of up to 40 mol pct SeO2. On the other hand, the presence of sharp diffraction peaks on the XRD spectra of samples containing 40 and 50 mol pct SeO2 confirms a formation of some polycrystalline phases distributed in the host glass network. Based on FTIR and NMR data, the glass structure at a short-range order exhibited a similar value of the fraction of tetrahedral boron (N4), particularly, for both samples of 0 and 5 mol pct SeO2. In this situation, SeO2 is as well as ZnO both played a modifier role. On the other hand, increasing SeO2 on expense of ZnO decreases the N4 fraction gradually. However, in SeO2-rich glass, most of boron atoms are mainly placed in three coordinated sites in BO3 units coordinated with SeO4 groups. Decreasing N4 fraction and increasing crystallization confirmed that SeO2 operates as a glass former and mainly as a crystalline agent. The results based on the TEM of the selected area of electron diffraction patterns (EDP) agree well with the ones obtained by XRD. The diffraction patterns clearly displayed two sets of diffraction rings: one is caused by boroselenite nanocrystals and the other by zinc selenite. In contrast, a broader halo of dispersed structure, known as an amorphous structure, is present in the diffraction pattern obtained from SeO2-free glass.
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