Abstract
The stress and electric fields in multilayer ceramic capacitors (MLCCs) under an applied electric bias were investigated by using a three-dimensional finite element model of ferroelectric ceramics. A coupled thermal–mechanical analysis was first made to calculate the residual thermal stress induced by the sintering process, and then a coupled electrical–mechanical analysis was performed to predict the total stress distribution in the MLCCs under a representative applied electric bias. The effects of the number of dielectric layers, the single layer thickness as well as the residual thermal stresses on the total stresses were all examined. The numerical results show that the residual thermal stress induced by the sintering process has a significant influence on the contribution of the total stresses and, therefore, should be taken into account in the design and evaluation of MLCC devices.
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