Influence of reactor neutrons irradiation on electrical, optical and structural properties of SnO 2 film prepared by sol–gel method

Abstract

SnO 2 films elaborated by sol–gel method were irradiated with reactor neutron. The irradiations were made at a temperature of about 40 °C, with fast neutron fluences ( E n >1.2 MeV) up to 9.6×10 17 n cm −2. The induced defect has been studied by electrical, optical and structural measurements. The electrical measurements show that the resistivity rapidly increases with increasing fluences up to 3.2×10 17 n cm −2 and remains constant for higher fluence (>6.4×10 17 n cm −2). The optical measurements show a small decrease of the optical band gap with increasing fluences. From the X-ray diffraction patterns, it was found that the crystallinity and grain size are reduced.