Abstract
We have prepared (ZnO) x (CdO) 1− x thin films by spray pyrolysis. Mixed thin film oxides with different compositions of cadmium and zinc were deposited on glass substrates and exposed to different annealing treatments at a fixed temperature. The effects due to post-thermal annealing on the structural, optical and electrical properties of the variable composition thin films have been studied depending upon the x value. The crystalline structure was studied by X-ray diffraction (XRD). We found the presence of CdO XRD patterns for low Zn concentrations, and a mixing of CdO (cubic) and ZnO (hexagonal) phases for low Cd concentrations. In all cases, the crystallite sizes increased with the annealing. In addition, the band-gap and the resistivity vary between those found for pure CdO and ZnO. The changes of the latter parameters with the post-thermal annealing are studied also as a function of the x value.
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