Abstract
This work reports the effect of thermal annealing (353–413 K) on structure and physical properties of thermally evaporated In10Ag10Sb10Se70 chalcogenide films. The samples were characterized by X-ray diffraction, transmission electron microscopy, TEM, Raman spectroscopy, optical absorption and photoconductivity measurements. Thermal annealing favours amorphous to polycrystalline structure transition with the growth of Se, AgInSe2 and AgSbSe2 phases. A significant change in position/shape of Raman bands upon annealing has been observed. The indirect optical gap decreases from 1.44 to 0.68 eV while tailing parameter increases with annealing. Photosensitivity decreases from 29.3 to 14.2 with annealing temperature. The decay of photocurrents is well fitted to stretched exponential function; the value of decay time constant increases while local minimum value of dispersion parameter at 353 K has been observed. These results are explained on the basis of amorphous crystalline phase transformation in chalcogenides and are important for developing new materials for emerging technologies.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Materials Science: Materials in Electronics
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
