Abstract
The influence of Pb excess on the properties of lead lanthanum titanate (PLT)ferroelectric thin films on Pt and LaNiO3 electrodes is studied in thispaper. Electron probe analysis results show that there is still quite anamount of excess Pb in PLT films after annealing at 550 °C for one hour.The distribution of excess Pb in the films is investigated by an Augerelectron spectroscopy (AES) depth profile. It is found that the bottomelectrodes have significant effects on both the content and the distributionof excess Pb in the PLT films. Meanwhile, the bottom electrodes have greateffects on the size of the grains and also on the distribution of the excessPb. The excess Pb and its appearance at grain boundaries and accumulation atthe interface between the film and bottom electrodes may act as pinningcentres and have a pinning effect on domains, which can be observed byabnormal P-E hysteresis loops and abnormal C-V curves. The excess Pbcontent in the films and Pb accumulation at the interface is high in the PLTfilms deposited on Pt/Ti/SiO2/Si; their pinning is severe. This is one ofthe primary reasons why the films have a high fatigue rate. While LaNiO3has absorbed most of the excess Pb in PLT films, the content of excess Pb inthe films deposited on LaNiO3/SiO2/Si is very low: the pinning effect ishardly observed. This is one of the primary reasons that the films havegood fatigue properties.
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