Abstract

The influence of oxygen vacancy behaviors during a cooling process in semiconductor gas sensors is discussed by the numerical analysis method based on the gradient-distributed oxygen vacancy model. A diffusion equation is established to describe the behaviors of oxygen vacancies, which follows the effects of diffusion and exclusion in the cooling process. Numerical analysis is introduced to find the accurate solutions of the diffusion equation. The solutions illustrate the oxygen vacancy distribution profiles, which are dependent on the cooling rate as well as the temperature interval of the cooling process. The gas-sensing characteristics of reduced resistance and response are calculated. Both of them, together with oxygen vacancy distribution, show the grain size effects and the re-annealing effect. It is found that the properties of gas sensors can be controlled or adjusted by the designed cooling process. The proposed model provides a possibility for sensor characteristics simulations, which may be beneficial for the design of gas sensors. A quantitative interpretation on the gas-sensing mechanism of semiconductors has been contributed.

Highlights

  • The successful invention of ZnO gas sensors by Seiyama in 1962 started the new era of the application of semiconductor in a gas detecting field [1]

  • The numerical analysis was carried out to find the numerical solutions of the diffusion equation of VOthe in numerical the semiconductor

  • Response were employed to check the validity of the calculation results, which shows good the diffusion equation of VO in the semiconductor grain

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Summary

Introduction

The successful invention of ZnO gas sensors by Seiyama in 1962 started the new era of the application of semiconductor in a gas detecting field [1]. The gas-sensing mechanism of semiconductors was understood by Morrison who concluded that gas detection was completed by the change in resistance of a sensor [17]. A specific region near the surface of a semiconductor grain, which is usually called a depletion layer, would decrease its resistance when exposed to reducing gases while the resistance would increase if oxidizing gases were introduced. This transducing process was achieved by the reaction between reducing gas and adsorbed oxygen or the competitive adsorption between adsorbed oxygen and oxidizing gas [18]. In 2009, Yamazoe concluded the gas-sensing mechanism of semiconductor into three levels including the Sensors 2018, 18, 3929; doi:10.3390/s18113929 www.mdpi.com/journal/sensors

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