Abstract
The on-orbit single-event upset (SEU) rate of nanodevices is closely related to the orbital parameters. In this paper, the on-orbit SEU rate (OOSR) induced by a heavy ion (HI), high-energy proton (HEP) and low-energy proton (LEP) for a 65 nm SRAM device is calculated by using the software SPACE RADIATION under different orbits based on the experimental data. The results indicate that the OOSR induced by the HI, HEP and LEP varies with the orbital parameters. In particular, the orbital height, inclination and shieling thickness are the key parameters that affect the contribution of the LEP to the total OOSR. Our results provide guidance for the selection of nanodevices on different orbits.
Highlights
With the continuous development of the integrated circuit industry and the increasing demand for low-power and high-performance devices in aerospace, nanodevices are widely used in space.these nanodevices are becoming more and more sensitive to single-event effects (SEEs).An SEE can be caused by only one single energetic particle incidence and eventually leads to a spacecraft anomaly or damage, so it has attached much attention
10Figure upsets/bit/day when shield thickness increased. It can be seen from the figure that the contribution of the low-energy proton (LEP) to the total on-orbit SEU rate (OOSR) is 37.7% when the shield thickness is 100 mils and decreases sharply as the shield thickness increases
Based on the experimental single-event upset (SEU) test data of the CYPRESS 65 nm CMOS SRAM, this paper. It can be seen from the figure that the contribution of the LEP to the total OOSR is 37.7% when the conducts a modeling study on the influence of orbital parameters on accurately estimating the OOSR
Summary
With the continuous development of the integrated circuit industry and the increasing demand for low-power and high-performance devices in aerospace, nanodevices are widely used in space. The ensuing concern is whether the direct ionization mechanism of LEPs will substantially increase the total on-orbit SEU rate (OOSR) Based on this consideration, researchers have conducted a series of investigations on LEP-induced SEUs for different types of devices and in various research perspectives [2,3,4,5,6,7,8,9,10,11], and the contribution of LEPs to the total. The focus of this paper is mainly to study the impact of satellite orbit parameters on OOSR prediction. In the study of OOSR prediction caused by LEPs, this paper does not just select several typical satellite orbits as in the previous study but conducts research on the continuous changes of each orbital parameter. The research results of this paper have great reference value for the application of nanodevices in aerospace, especially in the current commercial satellite field
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