Abstract
The thermal stability of sputtered RE/TM thin films is still a crucial factor in the magneto optical storage technology. To investigate this problem, the temperature dependent magnetic properties of TbFeCo single layers, which were covered from both sides by SiN protective layers, were analyzed by Kerr measurements and Kerr torque magnetometry. These investigations indicate that a nitrogen surplus during the preparation of the SiN coating leads to changes in the magnetic behaviour of the investigated films due to a reaction of Tb with nitrogen. This reaction changes the magnetic active TbFe composition in the interface region of the magnetic and the protective layer.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
