Abstract
Parametric X-ray radiation generated by a beam of relativistic electrons in a single-crystal wafer is studied in the Bragg geometry under conditions of multiple electron scattering at target atoms. Expressions are obtained that describe the spectral-angular and angular radiation density under conditions of multiple electron scattering. An increase in the influence of multiple scattering on the spectral-angular radiation density is demonstrated both with an increase in the target thickness and a decrease in the energy of relativistic electrons. It is shown that the asymmetry of the electron-field reflection relative to the target surface considerably affects the spectral-angular and angular densities of parametric X-ray radiation under the condition of strong multiple scattering.
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