Abstract
Parametric X-ray radiation generated by a beam of relativistic electrons in a single-crystal wafer is studied in the Bragg geometry under conditions of multiple electron scattering at target atoms. Expressions are obtained that describe the spectral-angular and angular radiation density under conditions of multiple electron scattering. An increase in the influence of multiple scattering on the spectral-angular radiation density is demonstrated both with an increase in the target thickness and a decrease in the energy of relativistic electrons. It is shown that the asymmetry of the electron-field reflection relative to the target surface considerably affects the spectral-angular and angular densities of parametric X-ray radiation under the condition of strong multiple scattering.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
