Abstract
A detailed atomic force microscopy (AFM) study of the conductance of hydrogenated single-crystal diamond (100) surfaces over submicron length scales is presented. The hydrogenation process was found to influence the surface morphology by reducing surface roughness, with the subsequent appearance of small triangular structures (with side lengths of 200 nm). Conducting AFM measurements revealed variations in the current and resistance that were related to the topography. Possible explanations include surface inhomogeneity of the electronic structure or variations in the contact resistance due to the surface roughness.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
