Abstract
Thin films (TFs) of cadmium sulphide (CdS) have been deposited at 300K on soda-lime substrates. The effect of the molar concentrations was investigated using the X-ray diffraction (XRD) and UV-Vis Spectrophotometer. The XRD measurements show that the TFs were crystalline and increases with increasing molarities. The optical characteristics of the films were studied at spectra range of 300 – 950 nm. It indicated that the band gap energy ranged between 1.80 to 1.83 eV. The films exhibited a high transmittance in the visible and near infrared regions with a low reflectance values within same regions. Other optical constants like extinction coefficient (K), refractive index (n), real (Ɛᵣ) and imaginary (Ɛᵢ) dielectric constants and optical conductivity (σ) were determined with respect to photon energy (eV). These properties of CdS TFs confirm that the material could be beneficial in various optoelectronics applications.
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