Abstract
The growth process of nanocrystalline fluorite was studied by in situ synchrotron radiation X-ray diffraction. The two studied samples had comparable crystalline domain size, but quite different content of lattice defects as a result of the different preparation procedures: ball milling of coarse CaF2 powder or coprecipitation of CaCl2 and NH4F. It is shown that the high dislocation density in the ball-milled fluorite is responsible for a recrystallization process above 773 K (500 °C), which is not observed in the chemically synthesized fluorite. The linear thermal expansion coefficients of both nanocrystalline powders, as obtained and also from the in situ X-ray diffraction data, show a smaller increase with temperature than suggested by the literature on coarse-grained fluorite.
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