Abstract
Effect of nitrogen and oxygen ion implantation (80 keV) on thin polycrystalline cobalt wire have been studied on the basis of residual loss angle and magnetic after-effect measurements from 300 K to 450 K, using an automated Maxwell bridge. On a strongly temperature-dependent residual loss angle curve, after oxygen ion implantation (dose 10/sup 19/ m/sup -2/), an additional-radiation maximum at 350 K occurs, which might be attributed to a relaxation effect due to a reorientational or migrational motion of interstitial atoms.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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