Abstract
We have investigated the effect of the internal electric fields on radiative and nonradiative processes in a series of AlN/GaN superlattices. The results of measurements involving direct detection of phonons emitted as a result of nonradiative recombination and carrier energy relaxation are compared with time resolved photoluminescence studies. Using these complementary techniques we have observed directly the effect of free carrier screening on the radiative and nonradiative recombination processes in the superlattice samples. We find that at high excitation power, photoinjected carriers screen the strong internal fields, resulting in an enhanced radiative recombination. As the carriers recombine, the descreening effect results in an increase in recombination via nonradiative processes, which we observe directly as a delayed phonon signal in the time of flight measurements.
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