Abstract

Tests using three selected terrain diffraction models, three available experimental datasets and three digital elevation products with different horizontal and vertical resolutions were carried out to assess the role of input terrain profile in diffraction modeling. It is demonstrated that low-resolution terrain maps are not, generally speaking, suitable for terrain diffraction modeling. Further, it is also shown that utilizing digital elevation products with medium spatial resolution results in predictions close to the case when high-resolution terrain maps are considered.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.