Abstract
Simulation calculations are made on the influence of inhomogeneity of junction parameters on correlated single-electron tunneling in a long one-dimensional array of small tunnel junctions. Current-voltage characteristics, static electric field dependence and frequency spectrum of voltage oscillations of the array are numerically calculated using the randomly scattered junction parameters. It is found that correlation of single-electron transfer is not seriously disturbed by inhomogeneity of the junction parameters.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
