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Search from 250 M+ research papersSearch from 250 M+ research papershttps://doi.org/10.1039/d2tc04397a
Copy DOI Journal: Journal of Materials Chemistry C |  Publication Date: Jan 1, 2022 |
 Citations: 1 |
Affiliation: China University of Geosciences (Beijing), University of Lille, Polytechnic University of Hauts-de-France, French National Centre for Scientific Research, École Centrale de Lille, Institute of Electronics, Microelectronics and Nanotechnology, BOE Technology Group (China), Key Laboratory for High Strength Lightweight Metallic Materials of Shandong Province, Shandong Academy of Sciences, Qilu University of TechnologyEtching residues of crystallized indium tin oxide (ITO) films deteriorate thin-film transistor (TFT) characteristics and negatively affect the display images.
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