Abstract
The influence of in-situ annealing temperature upon structural, micro-structural, magnetic properties and Gilbert damping parameters of sputtered Fe3O4 thin films (29–49 nm) upon SiO2/Si substrates have been systematically investigated. The oriented Fe3O4 structural phase was evaluated using grazing incidence X-ray diffraction, confocal Raman spectroscopy and X-ray photoelectron spectroscopy data. The atomic force and field-emission scanning electron microscope surface microstructural images reveal an enhanced grain growth with dominant anti-phase boundaries (APB) with in-situ annealing. The macroscopic spin dynamical response is evaluated using co-planar waveguide ferromagnetic resonance (CPW-FMR) spectroscopy from 15 to 35 GHz frequencies. The FMR data reveals a low Gilbert damping (α) ranging from 0.003 ± 0.001 to 0.009 ± 0.006 for all the in-situ annealed Fe3O4 thin films. Further, high inhomogeneity (ΔH0) parameter is correlated to the surface defects and APBs.
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