Abstract
Cu2ZnSnS4 (CZTS) thin films deposited using direct current magnetron sputtering and sulfurized at argon atmosphere pressures of 950, 460, and 50 mbar are studied in a view of solar cell absorber fabrication. The main novelty in the work is the influence of the radio frequency (RF) electromagnetic field treatment on the Cu2−xS secondary phase. The treatment reduces the amount of the Cu2−xS secondary phase, which is confirmed by Raman spectroscopy. The RF effect is long-term, at least one year later. So, this treatment is a promising technique to achieve higher purities of CZTS absorber layers for solar cells.
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