Influence of Grain Size and Film Formation Potential on the Diffusivity of Point Defects in the Passive Film of Pure Aluminum in NaCl Solution

Abstract

The influence of grain size on the corrosion behavior of pure aluminum and the defect density and diffusion coefficient of surface passive films were investigated using electron backscatter diffraction (EBSD) and electrochemical testing techniques, based on the point defect model (PDM). Samples with three different grain sizes (23 ± 11, 134 ± 52, and 462 ± 203 μm) were obtained by annealing at different temperatures and times. The polarization curves and electrochemical impedance spectroscopy results for the pure aluminum in the 3.5% NaCl solution showed that with decreasing grain size, the corrosion current (icorr) decreased monotonously, giving rise to a noble corrosion potential and a large polarization resistance. The Motte–Schottky results showed that the passive films that formed on pure aluminum with fine grains of 23 ± 11 μm had a low density (3.82 × 1020 cm−3) of point defects, such as oxygen vacancies and/or metal interstitials, and a small diffusion coefficient (1.94 × 10−17 cm2/s). The influence of grain size on corrosion resistance was discussed. This work demonstrated that grain refinement could be an effective approach to achieving high corrosion resistance of passive metals.