Abstract

The process of radiation defect formation in bulk Si 1− x Ge x alloy was investigated taking into account the dependence of introduction rates of primary radiation defects on the content of Ge and intensity of irradiation. A new expression was obtained which describes the dependence of divacancy concentration in Si 1− x Ge x alloy at various introduction rates of primary radiation defects under electron, thermal and fast neutron irradiation.

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